Aster Technologies - TestWay Express generates test programs
TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to test flow:
- Define the manufacturing line; including a combination of assembly, inspection and test machines.
- Estimate the test coverage of each individual stage and optimize the combined results.
- Generate the input files for each test stage that reflect the selected strategy.
- Measure the real test coverage by importing the post-debug test program or coverage data.
- Compare the early estimation with the actual measured test program coverage, identifying gaps in the overall strategy.
Test is essential for improving product quality by striving to detect and prevent faults on a product. This maximizes the number of good products shipped to the customer. It is important to:
- Define the optimum test strategy to maximize the test coverage.
- Produce a test specification document that defines what to test.
- Compare the developed tests against the test requirements.
- Understand the production process capability and determine an acceptable level of defects that can be shipped to the customer.
TestWay Express is built around TestWay, the industry leading DfT and test coverage analysis tool from the ASTER product portfolio.
Please use this link for further information on Yield, test, coverage and DFT.