Goepel

GOEPEL electronic has been one of the pioneers of the most innovative electrical test technology for electronic components and PCBs, JTAG/Boundary Scan. All engineering tasks required to introduce the Boundary Scan technology up to the generation of product-specific test programs as well as training seminars are part of the overall customer support by GOEPEL electronic.
In the meantime, Automated Optical Inspection has developed to one of the most commanding test technologies in electronic production. In the first year just a few systems were manufactured, but relatively quickly a product range emerged that found an appropriate infrastructure in the new company building, which was opened in 2003.
Additionally, the functional test of electronic assemblies and devices, in particular for Automotive Testing, has been one of the supporting pillars in the Company’s business activities. They are mainly focussed on the requirements of the automotive industry.
Furthermore the customized Functional Test Systems optimally suit for the automation of test runs. Integrated in a production line, as test system for final products or as repair station, versatile requirements can be realised with these systems.

Boundary Scan / JTAG & Emulation products

Boundary Scan Software

The performance of a Boundary Scan system is defined primarily by the capabilities and architecture of the software used. As the first vendor worldwide, GOEPEL electronic developed an Integrated Boundary Scan Development Environment in 1991, known as SYSTEM CASCON™. This unique Boundary Scan Workbench has been continuously improved with new intelligent tools and innovative new software features. Today, in its fourth generation, SYSTEM CASCON™ has acclaimed the status of an open graphical Boundary Scan Operation System with special features allowing extending the test coverage to the complete Unit Under Test (UUT).

Designed to meet customer demands, the integrated architecture of SYSTEM CASCON™ allows for a flexible custom configuration in four aspects. GOEPEL electronic offers predefined Packages, Stations and Editions for specific applications. These default configurations can be customized by upgrading and extending them with individual features. While CASCON POLARIS has been developed for FLASH and (C)PLD programming only, CASCON GALAXY is a universal software for test, verification and programming. The integrated SYSTEM Configuration and Licensing Manager provides the centralized functionality to handle this high degree of modularity and customization, controlled by Software Enable Codes. Existing installations can thus be upgraded at any time, even temporarily.

All logistics to automatically handle software updates and upgrades is available worldwide and 24/7 through our customer support website GENESIS.

image001

System CASCON GALAXY
CASCON Galaxy: tool for Boundary scan test and programming.

Short description:

  • Integrated JTAG/Boundary Scan development environment for test, verification and programming
  • JTAG/Boundary Scan programming language CASLAN with more than 150 commands
  • Library section with BSDL support and form editor for interactive model generation
  • Push button ATPG tool suite with anti ground bounce features
  • Automatic fault diagnosis on cell, pin and net level
  • JTAG/Boundary Scan testability analyzer for board and system level
  • ScanVision™ - Virtual Schematic and Layout Visualizer
  • Automatische Emulationstestgenerierung durch VarioTAP®
  • Multi mode debugger ScanAssist™
  • Digital waveform editor
  • Full network capability / floating license / FlexLM

Available Packages:
CASCON GALAXY® is available in three different editions (Advanced, Classic and Base). Its feature set is user-configurable, with simple upgrade paths to the fully-featured CASCON GALAXY®. All software functions are accessible through an intuitive graphical user interface. CASCON GALAXY® is based on modules with customizable feature sets, all integrated in one software application.


System CASCON POLARIS
CASCON Polaris: tool for boundary scan in-system programming only.

Short description:

  • Integrated JTAG/Boundary Scan development environment for In-System programming (ISP)
  • ATPG for Infrastructure Test
  • Easy manual FLASH programming with CASLAN programming language
  • Automatic FLASH Program Generator (AFPG)
  • Support of SVF, JAM/ STAPL for vector import, support of IEEE-Std.1532 (2002)
  • Library section with BSDL support and form editor for interactive model generation
  • Gang-programming support of multiple UUTs
  • Full network capability/ floating license / FlexLM

Available Packages:
CASCON POLARIS™ is available in three different editions (Advanced, Flash and PLD). Its feature set is user-configurable, with simple upgrade paths even to the fully-featured CASCON GALAXY®. All software functions are accessible through an intuitive graphical user interface. CASCON POLARIS™ is based on modules with customizable feature sets, all integrated in one software application.

VarioTAP
Fusion of JTAG Emulation and Boundary Scan.

Short description:

VarioTAP is a revolutionary technology for pattern streaming on TAP (Test Access Port) signals compliant with IEEE Std. 1149.1. The technology utilizes on-chip emulation resources accessible in many micro-processors and micro-controllers through a IEEE 1149.1 compatible JTAG Port. The VarioTAP principle was specifically developed for the integrated Boundary Scan software, SYSTEM CASCON™, and enables the complete fusion of Emulation tools with test and In-System-Programming (ISP) applications.

The VarioTAP specific adaptive streaming showcases the dynamic synthesis of Emulation vectors and Boundary Scan vectors, supporting new test strategies such as Interlaced JTAG/Boundary Scan Tests and In-System Emulation Test / ISP.

ChipVORX
ChipVORX technology supports any kind of embedded instrumentation - softcore or hardwired IPs, in an FPGA, ASIC or other IC chip. It is a mechanism to control embedded test structures inside the board components via a standard JTAG port, 1149.7 or P1687 compliant interfaces.

Short description:

The first application of ChipVORX®, is a new ultra fast in-system programming of every kind of Flash components assisted by FPGA-based intelligent IP instruments.
ChipVORX® technology also targets many other applications of embedded instrumentation. To list some of them: Built-In Self-Test, Bus Error Test, Signature Analysis and many others.
Due to the OEM cooperation with all leading vendors of In-Circuit Testers (ICT), Manufacturing Defect Analysers (MDA), Flying Probe Testers (FPT) and Functionality Testers (FT), the new technology is available for production with immediate effect.The new ChipVORX® IP instruments and models are supported as standard starting from SYSTEM CASCON™ version 4.5.4 and are activated by the licence manager like the system software. Regarding the hardware, ChipVORX® is completely supported by the controllers of the SCANBOOSTER™ family, as well as by the hardware platform SCANFLEX®.


Boundary Scan Hardware

SCANBOOSTER® - Low to midrange performance hardware

Available family members are SCANBOOSTER/PCI, SCANBOOSTER/USB, SCANBOOSTER/USB-FXT and SCANBOOSTER/PEC. These are JTAG/Boundary Scan controllers on PCI bus, PCI Cabled Express and USB2.0 basis, respectively, for JTAG/Boundary Scan test, (C)PLD/FPGA programming and FLASH In-System programming with limited amount of data.
The controller range provides optimal solutions in particular for standard applications with high cost pressure and lower performance requirements.

ControllerHost BusScan ArchitecturTCK max.TAPDigital I/OAnalogue I/O
SCANBOOSTER / XXX
PCI /
USB 2.0
Data Buffer
16 MHZ
2
32
2

SCANFLEX® - next generation hardware architecture for Extended Boundary Scan

Logo_Sscanflex

SCANFLEX® is a revolutionary new hardware platform, created to enable for extended Boundary Scan test and ISP solutions, taking full advantage of the technical potential provided by today’s and tomorrow’s standards. SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system. But it does not stop there, adding new capabilities for analog and mixed-signal test not found in competitive products.

The standardization of IEEE-Std. 1149.1 (Boundary Scan) in 1990 set the foundation for one of the most successful test technologies. Additional standards, based on the IEEE-Std. 1149.1 architecture, have been developed to support innovative test and in-system programming applications, in particular IEEE-Std. 1532, IEEE-Std. 1149.4, and IEEE-Std. 1149.6, and further standard development efforts are under way.

SCANFLEX® features:

button1
Total Modularity
button2
Modular platform consisting of SCANFLEX Controller, SCANFLEX TAP-Transceiver, and SCANFLEX I/O modules allowing individually (re)configurable solutions
button3
Modular expandable number of (up to 8) parallel, independent TAP and (up to 31) independent I/O modules, ensuring open scalability of required resources
button4
Modular, interchangeable TAP Interface Cards (TIC) support a variety of interface types and integration environments

button5
Extreme Flexibility
button6 Flexible electrical signal termination (up to 8 per TAP programmable interface parameters)
button7 Flexible distribution of the individual TAP’s and I/O modules with distances of up to 10m/33ft from the Controller without performance drop
button8 Flexible analog and digital resources on every TAP-Transceiver as standard configuration, systematically extendable with optional I/O modules

button9
Extraordinary Performance
button10 High-performance SPACETM II Controller Chipset supporting HYSCANTM for simultaneous handling of parallel I/O pattern and serial scan pattern up to 80MHz on 8 independent TAP’s
button11 Highly efficient synchronization of analog, digital and mixed signal resources with dynamic TAP operations and external trigger events
button12 Extensive configuration and upgrade management on-the-fly through SCANFLEX AutoDetect Feature and FASTSCALETM Technology

SCANFLEX® concept – an overview (example configuration)

scanflex-en

SCANFLEX® systems are controlled through a Boundary Scan Controller. This controller is responsible for simultaneous generation and dynamic distribution of serial patterns, parallel patterns, and control sequences, supporting three standard SFX and SFX/LS Interfaces. All SCANFLEX® Controllers are available in three performance classes (A/B/C). Refer to the product matrix below.

As front-end, SCANFLEX® systems use TAP-Transceiver modules. These modules are connected to the controller with the SFX cable (available in 2m/6ft, 5m/15ft, and 10m/33ft lengths). TAP Transceiver modules convert the data coming from the controller into respective operations of the built-in or added-on resources. TAP signals are provided through interchangeable TAP Interface Cards (TIC), allowing a nearly infinite range of front-end adaptations for various signal types, signal conditioning, and integration environments, including custom specific variants. SCANFLEX® TAP Transceivers are provided as desktop configurations, as well as in rack-mountable housings, and they can be adapted to custom specifications. As a standard configuration, TAP Transceivers also include analog and digital I/O resources, typically at least one SFX I/O slot, and one additional SFX/LS interface, providing ample of resources for extended Boundary Scan test solutions.

The third major component in a SCANFLEX® system is the optional I/O Module. These I/O modules are controlled independently from any other resources in the system through the SFX/LS interface. If the number of required SCANFLEX I/O Modules is very small (only 1 to 2 modules needed) the modules can be plugged directly onto the TAP-Transceiver, eliminating any additional cabling. Alternatively, I/O modules can be put into SCANFLEX Carriers, connected to the Controller or the TAP Transceiver through a SFX/LS cable (0.5m/1.5ft, 1m/3ft, 3m/10ft, or 5m/15ft). SCANFLEX® I/O Modules are used to extend the performance and capabilities of the Boundary Scan system with additional test instruments and programming resources, highly modular and scalable to match any specific test/ISP application. Custom specific modifications of standard modules and development of custom modules are offered through GÖPEL electronic’s engineering services.

Test and ISP applications benefit from SCANFLEX®
  1. Consistent hardware platform for a multitude of test and programming procedures
  2. Modular concept ensures lowest overhead through scalable, customizable solutions
  3. Optimized for integration into 3rd party Flying Probe, ICT, MDA, or Functional Test
  4. State-of-the-art system architecture with data splitting for serial and parallel resources
  5. Extended Boundary Scan tests with highest possible fault coverage
  6. The latest link technologies ensure high performance data transmission
  7. Open architecture ensures efficient support for today’s and tomorrow's standards
  8. Continuous expansion of the product portfolio, worldwide application support
  9. Custom specific front-end solutions through SCANFLEX® Engineering
  10. Complete support of all hardware features through SYSTEM CASCON® software
Some of the SCANFLEX® products

scanflex_products

SCANFLEX® product matrix

Below is a list of currently available SCANFLEX products. The product portfolio is being constantly expanded. Customer specific products are offered upon request.

SCANFLEX® Controller

ControllerHost BusScan ArchitecturTCK max.HYSCAN™ADYCS IIFASTSCALE
SFX/PCI1149-A /
SFX/PCI1149-B /
SFX/PCI1149-C
PCI
Data Buffer /
SPACE II /
SPACE II-S
20 MHZ /
50 MHZ /
80 MHZ
SFX/PXI1149-A /
SFX/PXI1149-B /
SFX/PXI1149-C
PXI
Data Buffer /
SPACE II /
SPACE II-S
20 MHZ /
50 MHZ /
80 MHZ
SFX/ASL1149-A / SFX/ASL1149-B / SFX/ASL1149-C

USB 2.0, Gigabit Ethernet, PEC

Data Buffer / SPACE II / SPACE II-S
20 MHZ /
50 MHZ /
80 MHZ
SFX/TSL1149-A /
SFX/TSL1149-B /
SFX/TSL1149-C

USB 2.0
LAN
FireWire

Data Buffer /
SPACE II /
SPACE II-S
20 MHZ /
50 MHZ /
80 MHZ

SCANFLEX® TAP Transceiver

TAP Transceiver TAPmax.TIC
(slot)
SFX
(I/0 slot)
Digital I/O*EVENT
I/0

ADC
DAC

TriggerPower Relays
SFX-TAP2 (Desktop)
2
1
32 bit
3
2
-
SFX-TAP4 (Desktop)
4
1
32 bit
3
2
-
SFX-TAP6 (Desktop)
6
1
32 bit
3
2
-
SFX-TAP8 (Desktop)
8/7
2/3
32 bit
3
2
3
SFX-TAP2/C (Compact)
2
Type 01
-
32 bit
3
2
-
SFX-TAP4/C (Compact)
4
Type 01
-
32 bit
3
2
-
*Every channel individually configurable as In/Out/Bidir/TriState. Programmable I/O voltage (1.8 V to 4.5 V) in groups of 16 channels.

SCANFLEX® TAP Interface Cards (TIC)

TICInterfaceTCK
Programming
Voltage
Programming
Impedance
Programming
DTI Delay
Programming
Special Features
Type 01
Single ended
1 KHz – 80 MHz @ step width of 250 Hz / 1MHz
Input 0.0 – 3.0 V
Output 1.8 – 4.5 V
Input und Output signals
ADYCS II
TAP Read back
Power Relay


SCANFLEX® I/O Module

I/O Module TypeChannelsVoltage
Programming
I/O Configuration Special Features
SFX 5296
Digital I/O
96 (3x32)
1.8 V – 4.5 V @ 3x32 channels
In/Out/Bidir/TS
UNSTRESS
SFX 1000
Prototype Board
-
-
-
-
SFX 1149.4
IEEE1149.4 Mixed-Signal Test Bus
1
-
-
ATAP and Measurement Circuitry

SCANFLEX® Carrier for I/O Module

CarrierSFX I/O slots ConfigurationPower Relays Power Supply
SFX Carrier5
(Desktop)
5
Single Carrier
3
External
SFX Carrier10
(Desktop)
10
2x Carrier 5 Board
6
Built-In
SFX Carrier15
(Desktop)
15
3x Carrier 5 Board
9
Built-In
SFX Carrier10
(19'Rack)
10
2x Carrier 5 Board
6
Built-In
SFX Carrier15
(19'Rack)
15
3x Carrier 5 Board
9
Built-In


Acronyms and Definitions

ADC Analog to Digital Converter
ADYCS II Advanced technology to compensate long cable delays or track delays
AutoDetect Technology to detect SCANFLEX units in an automated way
DAC Digital to Analog Converter
FASTSCALE Technology to upgrade Speed grade of Controller (A to B to C)
HYSCAN Technology to handle splitted serial and paralle data streams
ICP In-Circuit Programming
ICT In-Circuit Test
ISP In-System Programming
MDA Manufacturing Defect Analyzer
PIO Parallel I/O
SFX SCANFLEX
SPACE II Advanced Scan architecture for high performance scan operation
SPACE II - S Super advanced SPACE II technology for up to 80MHz
TAP Test Access Port
TCK Test Clock (BST signal defined in IEEE-Std.1149.1)
TDI Test Data In (BST signal defined in IEEE-Std.1149.1)
TDO Test Data Out (BST signal defined in IEEE-Std.1149.1)
TIC TAP Interface Card
TMS Test Mode Select (BST signal defined in IEEE-Std.1149.1)
UNSTRESS Protection Feature implemented in CION





Boundary Scan Accessories

To complete your test system, GÖPEL electronic provides several test accessories. Among them are circuits for the realization of additional Boundary Scan channels, a complete trainer kit as well as additional test modules. These test modules serve the extension of the Boundary Scan test environment and the realization of customer test tasks, such as the coupling to a flying probe tester. New tools are constantly developed. The following overview shows the use of the test accessories in different phases of the product life cycle as well as application requirements.

Overview:
The Multi Mode Probe is a universal multi-function device in form of a pen. It enables the statistic and dynamic check of IEEE 1149.1 signal busses and other potentials on digital logic level, analog measurement value level as well as waveform. It was designed for laboratory, repair stations and service applications.

The SCANPLUS® module series is a special extension hardware and can be used together with the SYSTEM CASCON™/ POLARIS™ Boundary Scan software and any scancontroller from GOEPEL electronic. They are based on the SCP-bus which is supported by all scancontrollers. The modules provide a modularly extendible test environment so that the Boundary Scan test is substantially extended, and further test procedures in combination with IEEE 1149.1 are possible. The achievable fault coverage is essentially increased. Due to this the application of SCANPLUS® modules is especially recommended for laboratory and even more so for production. Application-specific modules are available on request. As the SCANPLUS® series is continuously extended, please refer to the current product descriptions for further information.

The SCAN TRAINER is a complete package consisting of a demonstration board and IEEE 1149.1 software and hardware. It has been designed exclusively for training purposes. Yet, the IEEE 1149.1 hardware (Scan Booster) can also be used to configure standard Boundary Scan testers afterwards.

The CION™ and the U5624 can be used to set-up an extended test environment. It adds an external scanpath to the internal IEEE 1149.1 testbus. It is used to include, for example, plug connector pins in Boundary Scan tests. U5624 is especially useful in laboratory and production. Since U5624 is an end-of-life product, we recommended to use the CION for new applications.

The Boundary Scan Probe is a special debug hardware for IEEE 1149.1 circuits. With the help of the innovative logic probe the traditional Boundary Scan tests can be extended by additional logic information. The Boundary Scan Probe improves the efficiency of diagnostic debugging and simplifies the structural verification of BScan designs.

Request documentation

 

Latest News

twitteryoutube

jun-2017
EM Test New ESD Simulator

NX 30 - New 30kV ESD Simulator with Bleed-off function.
more...


EM Test Surge Generator for Solar Panel testing
New vSurge NX 20
more...


3-phase Power Sources from EM Test
Netwave Series
more...


MPE - World First Gb Ethernet Filter
Low-Pass EMI Filter
more...


Rental solutions for EMC instrumentation
Accelonix Rental Service
more...


05-may-2017
Accelonix at E&A 2017
Accelonix exhibiting at Electronics & Applications 2017.
May 30 May to June 1th, Jaarbeurs Utrecht.


22-feb-2017
TestWay Seminar

DFx Software Tools to Optimize PCBA Manufacturing & Test Strategy.
April 4, Eindhoven


08-feb-2017
Yxlon FeinFocus

Non-Destructive X-ray Inspection Technology for Electronics.
more...


01-feb-2017
Aster twSystem

New system level PCB viewer.
more...


26-jan-2017
Hesse New BJ 955/959

New Bonder platform for Manual and Automated Heavy Wire Bonding.
more...


18-jan-2017
Akrometrix

Thermal Warpage & Strain Metrology Measurement Systems.
more...


27-nov-2016
CyberTECHNOLOGIES
Non-Contact 3D Surface Metrology Measurement Systems.
more...


15-nov-2016
TPT Wire Bonding Workshop
Learn about Wire Bonding and discover the TPT Solutions during this Free Workshop!

 


sep-2016
XRH Count
Revolution in automatic, contactless SMT component counting!
more...


june-2016
FEE EMC Seminar
Thank you for visiting us in St-Katelijne-Waver


may-2016
Teseq ITS 6006B
Radiated immunity test system up to 6GHz, Second Generation released
more...



Teseq NSG 4070B
RF immunity test system up to 1GHz. Now also supports draft version (2015) of ISO 7637-4
more...



Teseq NSG 4060
Meets new immunity testing requirements range 15kHz-150kHz
more...



MPE Plug-in Tempest Filters
Protect your IT systems with this range of convenient, plug-in TEMPEST filters
more...


mar-2016
Accelonix BV has moved!
Accelonix has moved to a new office space since March 12th 2016
more...


jan-2016
Data I/O LumenX
Data I/O Ultra-Fast eMMC Programming!
more...


Accelonix News Archive