Quadtech

Cable and Cable Harness Testers

Instruments for multi-point Hipot, resistance, continuity and capacitance measurements - cable testers are electronic devices used to test the integrity of electrical points in a wired assembly or cable. Usually cable testing is comprised of a voltage meter, an electrical source, and a switching mechanism to connect the voltage meter and the source to all the contact points in the circuit. A more sophisticated cable tester, such as those sold by QuadTech, also have a display and microcontroller to automate the cable testing process and display the results of the test.

The Meridian offers customers more advanced testing capabilities and is set to replace the Horizon Series as QuadTech's featured cable tester. The Meridian is a versatile wire and harness analyzer that can be fully-integrated into an automated test assembly system or to be used as a stand-alone tester. The Meridian can test up to 1500VDC and 1067VAC and also features a fully-updated Windows-based user interface.

**Note - All units come fully calibrated at time of purchase.

Meridian Wire and Harness Analyzer

Meridian Left-SMALL

Meridian HV1 Meridian HV2 Meridian HV3 Meridian HV4 Meridian HV5 Meridian LV1
Other Capabilities High Voltage Cable Tester with capacitance measurement, High Voltage Analyzer, Low Cable Tester, Multi-Point Hipot, Cable Harness Tester, Harness Cable Testing
KEY FEATURES
Test Points 128 - 1024

128 - 1024

128 - 1024

128 - 1024 128 - 1024 128 - 1024
HVDC 1000

1500

 

1500 1000
HVAC

1067

1067 1067
HCDC - fixed

1 A, 28V

1 A, 28V

1 A, 28V

1 A, 28V 1 A, 28V
Test Voltage 5V 5V 5V 5V 5V 5V
Touch Screen Included Included Included Included Included Included
Digital I/O Ports Up to 11 Up to 11 Up to 11 Up to 11 Up to 11 Up to 11

 

Request documentation

 
Latest News

10-jun-2010
Finero
Launches their new QUANTI series®
more >>


06-apr-2010
Goepel electronic
In-System Emulation technology VarioTAP® expands to support Xilinx® FPGA
more >>


01-March-2010
New Accelonix website online


16-dec-2009
Goepel electronic
SCANFLEX JTAG/Boundary Scan extended test coverage for RS422/RS485-Interfaces
more >>


20-nov-2009
Data I/O
FlashCORE III Wins a 2009 Global Technology Award
more >>


13-nov-2009
Teseq
Introduces new & improved automotive emissions system
more >>


10-nov-2009
Goepel electronic
AXI System OptiCon X-Line 3D upgraded by double-sided AOI Inspection
more >>


12-okt-2009
Laplace Instruments ltd
Introduces new 61000-4-6 Conducted Immunity testsystem
more >>


1-okt-2009
Data I/O
Introduces Flashcore III technology
more >>


30-sept-2009
Accelonix
10th edition Boundary Scan Day
more >>