PCB Assembly & Test Boundary Scan / JTAG
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Goepel GOEPEL electronic has been one of the pioneers of the most innovative electrical test technology for electronic components and PCBs, JTAG/Boundary Scan. All engineering tasks required to introduce the Boundary Scan technology up to the generation of product-specific test programs as well as training seminars are part of the overall customer support by GOEPEL electronic. Boundary Scan / JTAG & Emulation products Boundary Scan Software The performance of a Boundary Scan system is defined primarily by the capabilities and architecture of the software used. As the first vendor worldwide, GOEPEL electronic developed an Integrated Boundary Scan Development Environment in 1991, known as SYSTEM CASCON™. This unique Boundary Scan Workbench has been continuously improved with new intelligent tools and innovative new software features. Today, in its fourth generation, SYSTEM CASCON™ has acclaimed the status of an open graphical Boundary Scan Operation System with special features allowing extending the test coverage to the complete Unit Under Test (UUT). Designed to meet customer demands, the integrated architecture of SYSTEM CASCON™ allows for a flexible custom configuration in four aspects. GOEPEL electronic offers predefined Packages, Stations and Editions for specific applications. These default configurations can be customized by upgrading and extending them with individual features. While CASCON POLARIS has been developed for FLASH and (C)PLD programming only, CASCON GALAXY is a universal software for test, verification and programming. The integrated SYSTEM Configuration and Licensing Manager provides the centralized functionality to handle this high degree of modularity and customization, controlled by Software Enable Codes. Existing installations can thus be upgraded at any time, even temporarily. All logistics to automatically handle software updates and upgrades is available worldwide and 24/7 through our customer support website GENESIS.
System CASCON GALAXY Short description:
Available Packages:
Short description:
Available Packages:
Short description: The VarioTAP specific adaptive streaming showcases the dynamic synthesis of Emulation vectors and Boundary Scan vectors, supporting new test strategies such as Interlaced JTAG/Boundary Scan Tests and In-System Emulation Test / ISP.
Boundary Scan Hardware SCANBOOSTER® - Low to midrange performance hardware Available family members are SCANBOOSTER/PCI, SCANBOOSTER/USB, SCANBOOSTER/USB-FXT and SCANBOOSTER/PEC. These are JTAG/Boundary Scan controllers on PCI bus, PCI Cabled Express and USB2.0 basis, respectively, for JTAG/Boundary Scan test, (C)PLD/FPGA programming and FLASH In-System programming with limited amount of data.
SCANFLEX® - next generation hardware architecture for Extended Boundary Scan
SCANFLEX® is a revolutionary new hardware platform, created to enable for extended Boundary Scan test and ISP solutions, taking full advantage of the technical potential provided by today’s and tomorrow’s standards. SCANFLEX excels when it comes to speed, flexibility, and modularity of a Boundary Scan test system. But it does not stop there, adding new capabilities for analog and mixed-signal test not found in competitive products. The standardization of IEEE-Std. 1149.1 (Boundary Scan) in 1990 set the foundation for one of the most successful test technologies. Additional standards, based on the IEEE-Std. 1149.1 architecture, have been developed to support innovative test and in-system programming applications, in particular IEEE-Std. 1532, IEEE-Std. 1149.4, and IEEE-Std. 1149.6, and further standard development efforts are under way. SCANFLEX® features:
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Some of the SCANFLEX® products
SCANFLEX® product matrix
Below is a list of currently available SCANFLEX products. The product portfolio is being constantly expanded. Customer specific products are offered upon request.
SCANFLEX® Controller
| Controller | Host Bus | Scan Architectur | TCK max. | HYSCAN™ | ADYCS II | FASTSCALE |
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SFX/PCI1149-A /
SFX/PCI1149-B /
SFX/PCI1149-C
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PCI
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Data Buffer /
SPACE II /
SPACE II-S
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20 MHZ /
50 MHZ /
80 MHZ
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√
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√
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√
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SFX/PXI1149-A /
SFX/PXI1149-B /
SFX/PXI1149-C
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PXI
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Data Buffer /
SPACE II /
SPACE II-S
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20 MHZ /
50 MHZ /
80 MHZ
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√
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√
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√
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SFX/ASL1149-A / SFX/ASL1149-B / SFX/ASL1149-C
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USB 2.0, Gigabit Ethernet, PEC |
Data Buffer / SPACE II / SPACE II-S
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20 MHZ /
50 MHZ /
80 MHZ
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√
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√
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√
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SFX/TSL1149-A /
SFX/TSL1149-B / SFX/TSL1149-C |
USB 2.0 |
Data Buffer /
SPACE II / SPACE II-S |
20 MHZ /
50 MHZ /
80 MHZ
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√
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√
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√
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SCANFLEX® TAP Transceiver
| TAP Transceiver | TAPmax. | TIC (slot) | SFX (I/0 slot) | Digital I/O* | EVENT I/0 |
ADC | Trigger | Power Relays |
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SFX-TAP2 (Desktop)
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2
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√
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1
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32 bit
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3
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2
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√
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-
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SFX-TAP4 (Desktop)
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4
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√
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1
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32 bit
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3
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2
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√
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-
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SFX-TAP6 (Desktop)
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6
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√
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1
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32 bit
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3
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2
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√
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-
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SFX-TAP8 (Desktop)
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8/7
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√
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2/3
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32 bit
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3
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2
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√
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3
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SFX-TAP2/C (Compact)
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2
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Type 01
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-
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32 bit
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3
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2
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√
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-
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SFX-TAP4/C (Compact)
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4
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Type 01
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-
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32 bit
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3
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2
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√
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-
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SCANFLEX® TAP Interface Cards (TIC)
| TIC | Interface | TCK Programming | Voltage Programming | Impedance Programming | DTI Delay Programming | Special Features |
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Type 01
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Single ended
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1 KHz – 80 MHz @ step width of 250 Hz / 1MHz
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Input 0.0 – 3.0 V
Output 1.8 – 4.5 V |
Input und Output signals
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ADYCS II
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TAP Read back
Power Relay |
SCANFLEX® I/O Module
| I/O Module | Type | Channels | Voltage Programming | I/O Configuration | Special Features |
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SFX 5296
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Digital I/O
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96 (3x32)
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1.8 V – 4.5 V @ 3x32 channels
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In/Out/Bidir/TS
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UNSTRESS
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SFX 1000
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Prototype Board
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-
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-
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-
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-
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SFX 1149.4
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IEEE1149.4 Mixed-Signal Test Bus
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1
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-
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-
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ATAP and Measurement Circuitry
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SCANFLEX® Carrier for I/O Module
| Carrier | SFX I/O slots | Configuration | Power Relays | Power Supply |
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SFX Carrier5
(Desktop) |
5
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Single Carrier
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3
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External
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SFX Carrier10
(Desktop) |
10
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2x Carrier 5 Board
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6
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Built-In
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SFX Carrier15
(Desktop) |
15
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3x Carrier 5 Board
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9
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Built-In
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SFX Carrier10
(19'Rack) |
10
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2x Carrier 5 Board
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6
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Built-In
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SFX Carrier15
(19'Rack) |
15
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3x Carrier 5 Board
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9
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Built-In
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Acronyms and Definitions
| ADC | Analog to Digital Converter |
| ADYCS II | Advanced technology to compensate long cable delays or track delays |
| AutoDetect | Technology to detect SCANFLEX units in an automated way |
| DAC | Digital to Analog Converter |
| FASTSCALE | Technology to upgrade Speed grade of Controller (A to B to C) |
| HYSCAN | Technology to handle splitted serial and paralle data streams |
| ICP | In-Circuit Programming |
| ICT | In-Circuit Test |
| ISP | In-System Programming |
| MDA | Manufacturing Defect Analyzer |
| PIO | Parallel I/O |
| SFX | SCANFLEX |
| SPACE II | Advanced Scan architecture for high performance scan operation |
| SPACE II - S | Super advanced SPACE II technology for up to 80MHz |
| TAP | |
| TCK | Test Clock (BST signal defined in IEEE-Std.1149.1) |
| TDI | Test Data In (BST signal defined in IEEE-Std.1149.1) |
| TDO | Test Data Out (BST signal defined in IEEE-Std.1149.1) |
| TIC | TAP Interface Card |
| TMS | Test Mode Select (BST signal defined in IEEE-Std.1149.1) |
| UNSTRESS | Protection Feature implemented in CION |
Boundary Scan Accessories
To complete your test system, GÖPEL electronic provides several test accessories. Among them are circuits for the realization of additional Boundary Scan channels, a complete trainer kit as well as additional test modules. These test modules serve the extension of the Boundary Scan test environment and the realization of customer test tasks, such as the coupling to a flying probe tester. New tools are constantly developed. The following overview shows the use of the test accessories in different phases of the product life cycle as well as application requirements.
Overview:
The Multi Mode Probe is a universal multi-function device in form of a pen. It enables the statistic and dynamic check of IEEE 1149.1 signal busses and other potentials on digital logic level, analog measurement value level as well as waveform. It was designed for laboratory, repair stations and service applications.
The SCANPLUS® module series is a special extension hardware and can be used together with the SYSTEM CASCON™/ POLARIS™ Boundary Scan software and any scancontroller from GOEPEL electronic. They are based on the SCP-bus which is supported by all scancontrollers. The modules provide a modularly extendible test environment so that the Boundary Scan test is substantially extended, and further test procedures in combination with IEEE 1149.1 are possible. The achievable fault coverage is essentially increased. Due to this the application of SCANPLUS® modules is especially recommended for laboratory and even more so for production. Application-specific modules are available on request. As the SCANPLUS® series is continuously extended, please refer to the current product descriptions for further information.
The SCAN TRAINER is a complete package consisting of a demonstration board and IEEE 1149.1 software and hardware. It has been designed exclusively for training purposes. Yet, the IEEE 1149.1 hardware (Scan Booster) can also be used to configure standard Boundary Scan testers afterwards.
The CION™ and the U5624 can be used to set-up an extended test environment. It adds an external scanpath to the internal IEEE 1149.1 testbus. It is used to include, for example, plug connector pins in Boundary Scan tests. U5624 is especially useful in laboratory and production. Since U5624 is an end-of-life product, we recommended to use the CION for new applications.
The Boundary Scan Probe is a special debug hardware for IEEE 1149.1 circuits. With the help of the innovative logic probe the traditional Boundary Scan tests can be extended by additional logic information. The Boundary Scan Probe improves the efficiency of diagnostic debugging and simplifies the structural verification of BScan designs.